Harrick Refractor2™ Grazing Angle Accessory

The Refractor2™ is a unique attachment for grazing angle specular reflectance spectroscopy. The Refractor2™ incorporates two SuperCharged™ wedged windows to refract the beam to and from the sample. It also includes a pre-mounted, internal Si polarizer for enhanced spectral contrast. The unique design of the Refractor2™ results in a compact FT-IR accessory that avoids the energy losses associated with the plane mirrors typically employed. The Refractor2™ is ideal for recording infrared spectra of thin films on metals and thin coatings on semiconductors. It is well suited for QC and laboratory FT-IR spectroscopy

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  • Cost effective.
  • Unobstructed, horizontal sampling surface for high sample throughput.
  • Fixed 75° incident angle and built-in, removable polarizer provides high spectral sensitivity for grazing angle spectroscopy.
  • Two SuperCharged™ ZnSe wedged windows refract the beam to and from the sample.
  • KRS-5 windows available on special order.
  • Compact.
  • SuperCharged™ for optimal energy throughput.
  • Easy to align and use.
  • Recommended minimum sample size: 1.5” x 0.6”.
  • PermaPurge™ for rapid sample exchange without interrupting the FT-IR purge.
  • Removable PermaPurge™ assembly - accommodates samples up to 4.75" wide when installed and even larger when removed.
  • Two SuperCharged™ ZnSe wedged windows.
  • Built-in Si polarizing plate.
  • Alignment mirror.
  • Mating hardware for the specified FT-IR spectrometer.

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Harrick Refractor2™ Grazing Angle Accessory

incorporates two SuperCharged™ wedged windows to refract the beam to and from the sample. It also includes a pre-mounted, internal Si polarizer for enhanced spectral contrast. The unique design of the Refractor2™ results in a compact FT-IR accessory that avoids the energy losses associated with the plane mirrors typically employed. The Refractor2™ is ideal for recording infrared spectra of thin films on metals and thin coatings on semiconductors. It is well suited for QC and laboratory FT-IR spectroscopy

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